IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel ROPUF for hardware security

2015 19th International Symposium on VLSI Design and Test (VDAT)

Author(s): Sauvagya Ranjan Sahoo ; Sudeendra Kumar ; Kamalakanta Mahapatra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Ahmedabad, India
Conference Date: 26 June 2015
Page(s): 1 - 2
ISBN (CD): 978-1-4799-1742-6
ISBN (Electronic): 978-1-4799-1743-3
DOI: 10.1109/ISVDAT.2015.7208093
Regular:

Physical Unclonable Functions (PUFs) are promising security primitives in recent times. A PUF is a die-specific random function or silicon biometric that is unique for every instance of the die.... View More

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