IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect Analysis over Multiple Release Versions of a Semiconductor Software System

2015 IEEE/ACM 1st International Workshop on Complex Faults and Failures in Large Software Systems (COUFLESS)

Author(s): Eric Abuta ; Jeff Tian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Florence, Italy
Conference Date: 23 May 2015
Page(s): 55 - 61
ISBN (Electronic): 978-1-4673-7034-9
DOI: 10.1109/COUFLESS.2015.16
Regular:

Demonstrating software reliability across multiple software revisions has become essential to end users of an end point detection system used in the semiconductor industry. This would enable them... View More

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