IEEE - Institute of Electrical and Electronics Engineers, Inc. - An interior point method for growing connected resistive networks

2015 American Control Conference (ACC)

Author(s): Sepideh Hassan Moghaddam ; Mihailo R. Jovanovic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Chicago, IL, USA
Conference Date: 1 July 2015
Page(s): 1,223 - 1,228
ISBN (CD): 978-1-4799-8685-9
ISBN (Electronic): 978-1-4799-8684-2
DOI: 10.1109/ACC.2015.7170900
Regular:

We consider the problem of growing connected networks of resistors where effective resistance is used as a performance metric. This problem can be cast as a semidefinite program by introducing an... View More

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