IEEE - Institute of Electrical and Electronics Engineers, Inc. - A feature selection method for comparision of each concept in big data

2015 IEEE/ACIS 14th International Conference on Computer and Information Science (ICIS)

Author(s): Takafumi Nakanishi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Las Vegas, NV, USA
Conference Date: 28 June 2015
Page(s): 229 - 234
ISBN (Electronic): 978-1-4799-8679-8
DOI: 10.1109/ICIS.2015.7166598
Regular:

In this paper, we present a new feature selection method for comparison of each event in big data. The method selects appropriate features for comparing or evaluating each event when we prepare an... View More

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