IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test suite reduction for mutation testing based on formal concept analysis

2015 IEEE/ACIS 16th International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)

Author(s): Liping Li ; Honghao Gao
Sponsor(s): IEEE Comput.Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Takamatsu, Japan
Conference Date: 1 June 2015
Page(s): 1 - 5
ISBN (Electronic): 978-1-4799-8676-7
DOI: 10.1109/SNPD.2015.7176239
Regular:

Formal concept analysis (FCA) is a method used for deriving implicit relationships between objects by attributes. Aim at the expensive cost problem in mutation testing caused by the large number... View More

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