IEEE - Institute of Electrical and Electronics Engineers, Inc. - Innovation process as a basis of enterprises of high-tech industries

2015 XVIII International Conference on Soft Computing and Measurements (SCM)

Author(s): N. V. Lashmanova ; M. G. Osipova
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: St. Petersburg, Russia
Conference Date: 19 May 2015
Page(s): 275 - 277
ISBN (Electronic): 978-1-4673-6961-9
ISBN (Paper): 978-1-4673-6960-2
DOI: 10.1109/SCM.2015.7190482
Regular:

The article is devoted to the problem of innovation process and R&D management. During risk-analysis process R&D risks should be classified according to the stages of R&D projects.

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