IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using a visible BI to construct lean manufacturing within big data

2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

Author(s): S. H. Chiu ; H. K. Lin ; Jung Pin Hsu ; Che Yu Chiu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Saratoga Springs, NY, USA
Conference Date: 3 May 2015
Page(s): 241 - 244
ISBN (Electronic): 978-1-4799-9930-9
DOI: 10.1109/ASMC.2015.7164480
Regular:

There are several factors to influence effectiveness of manufacturing. People productivity is one of very important factor that helps to construct lean manufacturing that provides profit of... View More

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