Optical Society (The) (OSA) - Improvement in in-plane localization precision of nanoparticles using interference analysis

2015 Conference on Lasers and Electro-Optics (CLEO)

Author(s): Amihai Meiri ; Carl G. Ebeling ; Jason Martineau ; Zeev Zalevsky ; Jordan M. Gerton ; Rajesh Menon
Publisher: Optical Society (The) (OSA)
Publication Date: 1 May 2015
Conference Location: San Jose, CA, USA
Conference Date: 10 May 2015
Page(s): 1 - 2
ISBN (Electronic): 978-1-55752-968-8
DOI: 10.1364/CLEO_AT.2015.JW2A.88
Regular:

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of... View More

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