IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning where to inspect: Location learning for crime prediction

2015 IEEE International Conference on Intelligence and Security Informatics (ISI)

Author(s): Mohammad A. Tayebi ; Uwe Glausser ; Patricia L. Brantingham
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Baltimore, MD, USA
Conference Date: 27 May 2015
Page(s): 25 - 30
ISBN (CD): 978-1-4799-9888-3
ISBN (Electronic): 978-1-4799-9889-0
DOI: 10.1109/ISI.2015.7165934
Regular:

Crime studies conclude that crime does not occur evenly across urban landscapes but concentrates in certain areas. Spatial crime analysis, primarily focuses on crime hotspots, areas with... View More

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