IEEE - Institute of Electrical and Electronics Engineers, Inc. - ProvErr: System Level Statistical Fault Diagnosis Using Dependency Model

2015 15th IEEE/ACM International Symposium on Cluster, Cloud and Grid Computing (CCGrid)

Author(s): Peng Chen ; Beth A. Plale
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Shenzhen, China
Conference Date: 4 May 2015
Page(s): 525 - 534
ISBN (Electronic): 978-1-4799-8006-2
DOI: 10.1109/CCGrid.2015.86
Regular:

Large-scale distributed systems are difficult to debug in the event of failure. Yet rapid fault diagnosis that pinpoints failures to the component level is critical to fast recovery. We introduce... View More

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