IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic ISD scheme for the AVM system - a preliminary study

2015 IEEE International Conference on Robotics and Automation (ICRA)

Author(s): Yao-Sheng Hsieh ; Fan-Tien Cheng ; Chun-Fang Chen ; Jhao-Rong Lyu ; Ting-Yu Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Seattle, WA, USA
Conference Date: 26 May 2015
Page(s): 2,060 - 2,065
ISBN (Electronic): 978-1-4799-6923-4
ISBN (DVD): 978-1-4799-6921-0
DOI: 10.1109/ICRA.2015.7139469
Regular:

Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling... View More

Advertisement