IEEE - Institute of Electrical and Electronics Engineers, Inc. - An ECC-based memory architecture with online self-repair capabilities for reliability enhancement

2015 20th IEEE European Test Symposium (ETS)

Author(s): Gian Mayuga ; Yuta Yamato ; Tomokazu Yoneda ; Michiko Inoue ; Yasuo Sato
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Cluj-Napoca, Romania
Conference Date: 25 May 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-7603-4
DOI: 10.1109/ETS.2015.7138734
Regular:

Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. To keep up with the development pace of nanoscale devices, enhancement methods for yield and... View More

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