IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of approach for predicting software defect density using static metrics

2015 International Conference on Computing, Communication & Automation (ICCCA)

Author(s): Neeraj Mandhan ; Dinesh Kumar Verma ; Shishir Kumar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Noida, India
Conference Date: 15 May 2015
Page(s): 880 - 886
ISBN (CD): 978-1-4799-8889-1
ISBN (Electronic): 978-1-4799-8890-7
DOI: 10.1109/CCAA.2015.7148499
Regular:

Now a day's software development is growing rapidly. Due to this, there is also a rapid growth in the number of occurrences of defects. In this paper, defect density had been predicted using the... View More

Advertisement