IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of pressure and bias voltage on the phase noise of CMOS-MEMS oscillators

2015 Joint Conference of the IEEE International Frequency Control Symposium & the European Frequency and Time Forum (FCS)

Author(s): Wan-Cheng Chiu ; Ming-Huang Li ; Chao-Yu Chen ; Sheng-Shian Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Denver, CO, USA
Conference Date: 12 April 2015
Page(s): 155 - 157
ISBN (CD): 978-1-4799-8865-5
ISBN (Electronic): 978-1-4799-8866-2
DOI: 10.1109/FCS.2015.7138812
Regular:

In this work, we present a comprehensive study on the effects of environmental pressure (P) and resonator dc-bias voltage for the phase noise of a monolithic CMOS-MEMS oscillator. In order to... View More

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