IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analyzing temperature dependence of Electrical Impedance Myography parameters using finite element model

SoutheastCon 2015

Author(s): Khondokar M. F. Rabbi ; Somen Baidya ; Mohammad A. Ahad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Fort Lauderdale, FL, USA
Conference Date: 9 April 2015
Page(s): 1 - 2
ISBN (Electronic): 978-1-4673-7300-5
ISSN (Electronic): 1558-058X
DOI: 10.1109/SECON.2015.7132910
Regular:

Electrical Impedance Myography (EIM) is a non-invasive electrophysiological approach for the assessment of neuromuscular diseases. Finite element model of the EIM experiment has been... View More

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