IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on image denoising using patch-based singular value decomposition

2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE)

Author(s): Han Liu ; Yue Zhao ; Lili Liang ; Yingmin Yi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Halifax, NS, Canada
Conference Date: 3 May 2015
Page(s): 643 - 647
ISBN (Electronic): 978-1-4799-5829-0
ISBN (Paper): 978-1-4799-5827-6
ISSN (Paper): 0840-7789
DOI: 10.1109/CCECE.2015.7129350
Regular:

This paper presents an efficient patch-based image denoising scheme by using singular value decomposition (SVD). In this scheme, similar image patches are simply grouped together from a noisy... View More

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