IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing 90 nm microcontroller SRAM PUF quality

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

Author(s): Mario Barbareschi ; Ermanno Battista ; Antonino Mazzeo ; Nicola Mazzocca
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Naples, Italy
Conference Date: 21 April 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-1999-4
DOI: 10.1109/DTIS.2015.7127360
Regular:

In digital systems, Static Random Access Memories (SRAMs) play an important role since they are available in almost every digital devices and are able to realize Physically Unclonable Functions... View More

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