IEEE - Institute of Electrical and Electronics Engineers, Inc. - Critical charge dependence of correlation of different neutron sources for soft error testing

2015 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Hiroko Mori ; Taiki Uemura ; Hideya Matsuyama ; Shin-ichiro Abe ; Yukinobu Watanabe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Monterey, CA, USA
Conference Date: 19 April 2015
ISBN (Electronic): 978-1-4673-7362-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2015.7112678
Regular:

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test... View More

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