IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of electrode surface modulation on time-dependent dielectric breakdown

2015 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Kong Boon Yeap ; Tian Shen ; Galor Wenyi Zhang ; Sing Fui Yap ; Brian Holt ; Arfa Gondal ; Seungman Choi ; San Leong Liew ; Walter Yao ; Patrick Justison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Monterey, CA, USA
Conference Date: 19 April 2015
ISBN (Electronic): 978-1-4673-7362-3
ISSN (Electronic): 1938-1891
DOI: 10.1109/IRPS.2015.7112668
Regular:

This study demonstrates the impact of electrode surface modulation on conduction mechanism and TDDB behavior. We found that the Schottky barrier height can be decreased by an unexpected change of... View More

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