IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mathematical analysis of startup mark in elastic tape on a narrow fabric loom

2015 Moratuwa Engineering Research Conference (MERCon)

Author(s): H. D. C. T. Dayaratne ; Ranishka Premakumara ; Thanura Perera ; Stephan Prince ; E. A. S. K. Fernando ; T. S. S. Jayawardane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Moratuwa, Sri Lanka
Conference Date: 7 April 2015
Page(s): 50 - 54
ISBN (Electronic): 978-1-4799-1740-2
ISBN (DVD): 978-1-4799-1739-6
DOI: 10.1109/MERCon.2015.7112319
Regular:

Start-up marks are considered as one of the major defect in woven fabric, it occurs when the loom is restarted after loom stoppage due to various reasons. This defect is more prominent in high... View More

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