IEEE - Institute of Electrical and Electronics Engineers, Inc. - Innovative practices session 7C: Mixed signal test and debug

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Suriya Natarajan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA, USA
Conference Date: 27 April 2015
Page(s): 1
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116282
Regular:

The traditional focus of work in test has been innovation and efficiency for high volume manufacturing test. However, in reality, a significant amount of effort is expended on design validation... View More

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