IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory repair for high defect densities

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Michael Nicolaidis ; Panagiota Papavramidou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA
Conference Date: 27 April 2015
Page(s): 1 - 4
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116277
Regular:

We illustrate that memory repair for high defect densities allows improving yield, extending circuit life, reducing power, and improving reliability, and can be used to push aggressively the... View More

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