IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving diagnosis resolution of a fault detection test set

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Andreas Riefert ; Matthias Sauer ; Sudhakar Reddy ; Bernd Becker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA
Conference Date: 27 April 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116269
Regular:

Manufactured VLSI circuits using a new technology typically suffer from systematic defects that are process-dependent and at sub-nanometer feature sizes such defects may be even design-dependent.... View More

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