IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical techniques for predicting system-level failure using stress-test data

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Harry H. Chen ; Shih-Hua Kuo ; Jonathan Tung ; Mango C.-T Chao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA
Conference Date: 27 April 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116260
Regular:

In this paper we describe a novel scheme for collecting and analyzing a chip's failure signature. Incorrect outputs of digital chips are forced by applying scan patterns under non-destructive... View More

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