IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extracting effective functional tests from commercial programs

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Sreekumar Vadakke Kodakara ; Mehul V. Sagar ; Joel Yuen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA
Conference Date: 27 April 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116259
Regular:

We describe a tool and methodology for extracting short and effective functional tests from long running commercial programs and manufacturing system tests for testing microprocessors and SOCs.... View More

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