IEEE - Institute of Electrical and Electronics Engineers, Inc. - Innovative practices session 2C: New technologies, new challenges - 2

2015 IEEE 33rd VLSI Test Symposium (VTS)

Author(s): Suraj Sindia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Napa, CA, USA, USA
Conference Date: 27 April 2015
Page(s): 1
ISBN (Electronic): 978-1-4799-7597-6
DOI: 10.1109/VTS.2015.7116258
Regular:

As the economics of traditional devices scaling changes, alternative solutions to increase transistor counts in semiconductor packages are being explored, including various multi-die integration... View More

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