IEEE - Institute of Electrical and Electronics Engineers, Inc. - JSEFT: Automated Javascript Unit Test Generation

2015 IEEE 8th International Conference on Software Testing, Verification and Validation (ICST)

Author(s): Shabnam Mirshokraie ; Ali Mesbah ; Karthik Pattabiraman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2015
Conference Location: Graz, Austria
Conference Date: 13 April 2015
Page(s): 1 - 10
ISBN (Electronic): 978-1-4799-7125-1
DOI: 10.1109/ICST.2015.7102595
Regular:

The event-driven and highly dynamic nature of JavaScript, as well as its runtime interaction with the Document Object Model (DOM) make it challenging to test JavaScript-based applications. Current... View More

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