IEEE Electromagnetic Compatibility Society (EMC) - Mutual coupling effects in through-the-wall imaging of targets behind wall structures

2015 31st International Review of Progress in Applied Computational Electromagnetics (ACES)

Author(s): Quang Nguyen ; Ozlem Kilic
Publisher: IEEE Electromagnetic Compatibility Society (EMC)
Publication Date: 1 March 2015
Conference Location: Williamsburg, VA, USA
Conference Date: 22 March 2015
Page(s): 1 - 2
ISBN (Electronic): 978-0-9960-0781-8

In this paper, we investigate the mutual coupling effects between complex wall structures and the target for through-the-wall imaging applications. We propose a hybrid technique, which is more... View More