IEEE - Institute of Electrical and Electronics Engineers, Inc. - The impact of Quality Maintenance Pillar of TPM on manufacturing performance

2015 International Conference on Industrial Engineering and Operations Management (IEOM)

Author(s): Sachit Vardhan ; Pardeep Gupta ; Vaibhav Gangwar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2015
Conference Location: Dubai, United Arab Emirates
Conference Date: 3 March 2015
Page(s): 1 - 6
ISBN (CD): 978-1-4799-6064-4
ISBN (Electronic): 978-1-4799-6065-1
DOI: 10.1109/IEOM.2015.7093741
Regular:

The purpose of this paper is to demonstrate the contributions of Quality Maintenance (QM) Pillar of TPM approach in improving the product quality in a food industry manufacturing potato chips. QM... View More

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