IEEE - Institute of Electrical and Electronics Engineers, Inc. - Material Characterization by Line-Focus-Beam Acoustic Microscope

Author(s): J.-I. Kushibiki ; N. Chubachi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1985
Volume: 32
Page(s): 189 - 212
ISSN (Paper): 0018-9537
DOI: 10.1109/T-SU.1985.31586
Advertisement