IEEE - Institute of Electrical and Electronics Engineers, Inc. - Switching properties of electromechanically bistable and multistable bridges for nonvolatile memory applications

2008 IEEE Silicon Nanoelectronics Workshop (SNW 2008)

Author(s): Y. Tsuchiya ; S. Matsuda ; T. Nagami ; S. Saito ; T. Arai ; T. Shimada ; S. Oda ; H. Mizuta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Honolulu, HI, USA
Conference Date: 15 June 2008
Page(s): 1 - 2
ISBN (Paper): 978-1-4244-2071-1
DOI: 10.1109/SNW.2008.5418472
Regular:

The nonvolatile NEMS memory concept is based on the electro-mechanical bistability of the sub--+m-long NEMS structure (Fig. 1). It features a buckled SiO2 bridge which is suspended in... View More

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