IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory characteristics improvement encouraged by the shape of narrow drain in cone SONOS memory structure

2008 IEEE Silicon Nanoelectronics Workshop (SNW 2008)

Author(s): Gil Sung Lee ; Il Han Park ; Seongjae Cho ; Jang-Gn Yun ; Jung Hoon Lee ; Dong Hua Li ; Doo Hyun Kim ; Yoon Kim ; Se Hwan Park ; Won Bo Sim ; Jong Duk Lee ; Byung-Gook Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Honolulu, HI, USA
Conference Date: 15 June 2008
Page(s): 1 - 2
ISBN (Paper): 978-1-4244-2071-1
DOI: 10.1109/SNW.2008.5418386
Regular:

We have proposed cone SONOS memory structure previously. The point of the structure is field concentration effect in two directions. Among the two, concentration of source to drain direction is... View More

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