IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrical Impedance Computed Tomography Based on a Finite Element Model

Author(s): Tadakuni Murai ; Yukio Kagawa
Sponsor(s): IEEE Engineering In Medicine and Biology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1985
Volume: BME-32
Page(s): 177 - 184
ISSN (Electronic): 1558-2531
ISSN (Paper): 0018-9294
DOI: 10.1109/TBME.1985.325526
Regular:

A simulation study of electrical impedance computed tomography is presented. This is an inverse problem. A field is discretized by the finite element method and an iterative approach derived from... View More

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