IEEE - Institute of Electrical and Electronics Engineers, Inc. - Calculation of BGA contact resistance by using the contacts volume method

2008 31st International Spring Seminar on Electronics Technology (ISSE 2008)

Author(s): R. Wrona ; Z. Drozd
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Budapest, Hungary
Conference Date: 7 May 2008
Page(s): 37 - 40
ISBN (CD): 978-1-4244-3974-4
ISBN (Paper): 978-1-4244-3972-0
DOI: 10.1109/ISSE.2008.5276478
Regular:

In Warsaw University of Technology was developed special BGA256r test specimen [1] for early failure detection during the reliability tests. The failures were detected by resistance measurement by... View More

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