IEEE - Institute of Electrical and Electronics Engineers, Inc. - Customer Churn Prediction Based on SVM-RFE

2008 International Seminar on Business and Information Management (ISBIM 2008)

Author(s): Cao Kang ; Shao Pei-ji
Sponsor(s): Eng. Technol. Press, Hong Kong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, China
Conference Date: 19 December 2008
Volume: 1
Page(s): 306 - 309
ISBN (Paper): 978-0-7695-3560-9
DOI: 10.1109/ISBIM.2008.174
Regular:

As markets become increasingly saturated, churn prediction and management has become of great concern to many industries. A company wishing to retain its customers needs to be able to predict... View More

Advertisement