IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low overlap image registration based on both entropy and mutual information measures

OCEANS 2008

Author(s): C. de Cesare ; M.-J. Rendas ; A.-G. Allais ; M. Perrier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Quebec City, QC, Canada
Conference Date: 15 September 2008
Page(s): 1 - 9
ISBN (CD): 978-1-4244-2620-1
ISBN (Paper): 978-1-4244-2619-5
DOI: 10.1109/OCEANS.2008.5152067
Regular:

In this paper, a new approach to image matching based on both entropy and mutual information measures that can correctly perform association under very low overlap conditions is presented. The... View More

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