IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fine-Grained Parameter Configuration Model for Failure Detection in Overlay Network Systems

2008 International Conference on Multimedia and Information Technology (MMIT 2008)

Author(s): Jijun Cao ; Jinshu Su ; Yongjun Wang ; Zhigang Sun
Sponsor(s): Int. Sci. Eng. Center, Hong Kong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Three Gorges, China
Conference Date: 30 December 2008
Page(s): 580 - 585
ISBN (Paper): 978-0-7695-3556-2
DOI: 10.1109/MMIT.2008.155
Regular:

Failure detection is a significant challenge in most overlay network systems. And the choice of parameter configuration for a given failure detection scheme has a significant impact on the... View More

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