IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of a New Image Recognition Technology in Fabric Defect Detection

2008 International Seminar on Future Biomedical Information Engineering (FBIE 2008)

Author(s): Bo Cui ; Haiying Liu ; Tongze Xue
Sponsor(s): Eng. Technol. Press, Hong Kong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Wuhan, Hubei, China
Conference Date: 18 December 2008
Page(s): 67 - 70
ISBN (Paper): 978-0-7695-3561-6
DOI: 10.1109/FBIE.2008.85
Regular:

At present, defect detection during the manufacturing are still finished by man, there are a lot of weaknesses by this way, such as low detection efficiency, high miss rate. All of these affect... View More

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