IEEE - Institute of Electrical and Electronics Engineers, Inc. - Magnetic field reduction using metal screening for electron microscope: A case study

2008 10th International Conference on Electromagnetic Interference & Compatibility (INCEMIC 2008)

Author(s): S.R. Ranade ; M.Y. Joshi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2008
Conference Location: Bangalore, India
Conference Date: 26 November 2008
Page(s): 173 - 175
ISBN (Paper): 978-81-903575-1-7
Regular:

The paper presents the countermeasures to reduce the influence of an external magnetic field in the beam area of an electron microscope that is required to be minimal for achieving accurate image... View More

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