IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhancing Sequential LEC Using a Cumulative Verification Methodology

2008 Ninth International Workshop on Microprocessor Test and Verification (MTV 2008)

Author(s): N. Sheeley ; N. Pena ; I. Waheed ; M. Nodine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Austin, TX, USA
Conference Date: 8 December 2008
Page(s): 39 - 42
ISBN (Paper): 978-1-4244-3682-8
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2008.10
Regular:

This paper describes a methodology for verifying sequentially optimized designs using sequential equivalence checking. The problems associated with verifying large designs with complex changes... View More

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