IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Methodology for the Test of SoCs and for Analyzing Elusive Failures

2008 Ninth International Workshop on Microprocessor Test and Verification (MTV 2008)

Author(s): A. Weiss ; C. Hochberger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Austin, TX, USA
Conference Date: 8 December 2008
Page(s): 18 - 23
ISBN (Paper): 978-1-4244-3682-8
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2008.14
Regular:

The increasing complexity of SoCs in form of more complex architecture designs and smaller structures qualifies test procedures and failure analysis as one of the key skills in the semiconductor... View More

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