IEEE - Institute of Electrical and Electronics Engineers, Inc. - Generating Method of Pair-Wise Covering Test Data Based on ACO

2008 International Workshop on Education Technology and Training & 2008 International Workshop on Geoscience and Remote Sensing

Author(s): Kewen Li ; Zhixia Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 21 December 2008
Volume: 2
Page(s): 776 - 779
ISBN (Paper): 978-0-7695-3563-0
DOI: 10.1109/ETTandGRS.2008.358
Regular:

Optimizing test suite can reduce the cost of time and resources, and improve the efficiency of regression test when test cases are generated. The generation of pair-wise covering test data is an... View More

Advertisement