IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Wavelet Transform in Single Training Sample Extraction of VEP

2008 International Workshop on Education Technology and Training & 2008 International Workshop on Geoscience and Remote Sensing

Author(s): Zhen Zhang ; Sheng-li Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Shanghai, China
Conference Date: 21 December 2008
Volume: 2
Page(s): 77 - 80
ISBN (Paper): 978-0-7695-3563-0
DOI: 10.1109/ETTandGRS.2008.145
Regular:

Based on the good localization characteristic of the wavelet transform both in time and frequency domain, a de-noising method based on wavelet transform is presented, which can make happen the... View More

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