IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extension of the Reed-Mallett-Brennan loss for application to stap with collected data

2008 42nd Asilomar Conference on Signals, Systems and Computers

Author(s): C.M. Teixeira
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Pacific Grove, CA, USA
Conference Date: 26 October 2008
Page(s): 1,684 - 1,689
ISBN (CD): 978-1-4244-2941-7
ISBN (Paper): 978-1-4244-2940-0
ISSN (Paper): 1058-6393
DOI: 10.1109/ACSSC.2008.5074712
Regular:

The post-processed signal-to-interference-plus-noise ratio (SINR) has emerged as a critical performance metric in the assessment of space-time adaptive processing (STAP) as applied to radar... View More

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