IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust regression to varying data distribution and its application to landmark-based localization

2008 IEEE International Conference on Systems, Man and Cybernetics (SMC 2008)

Author(s): Sunglok Choi ; Jong-Hwan Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Singapore, Singapore
Conference Date: 12 October 2008
Page(s): 3,465 - 3,470
ISBN (CD): 978-1-4244-2384-2
ISBN (Paper): 978-1-4244-2383-5
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2008.4811834
Regular:

Data may be wrongly measured or come from other sources. Such data is a big problem in regression, which retrieve parameters from data. Random sample consensus (RANSAC) and maximum likelihood... View More

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