IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of the most influencing factors in the preliminary test of the GEPT - based on GM(0,N)

2008 IEEE International Conference on Systems, Man and Cybernetics (SMC 2008)

Author(s): Hsiao-Ching Chen ; Chung-Cheng Lu ; Jee-Ray Wang ; Hui-Yi Liang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Singapore, Singapore
Conference Date: 12 October 2008
Page(s): 2,856 - 2,859
ISBN (CD): 978-1-4244-2384-2
ISBN (Paper): 978-1-4244-2383-5
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2008.4811730
Regular:

The main purpose of this paper is to apply GM(0,N) model to weigh problem on the topic of a study of the most influential part in the first stage of the GEPT. ldquoEnglish proficiencyrdquo plays... View More

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