IEEE - Institute of Electrical and Electronics Engineers, Inc. - Local mixture hazard model: A semi-parametric approach to risk management in pavement system

2008 IEEE International Conference on Systems, Man and Cybernetics (SMC 2008)

Author(s): Le Thanh Nam ; K. Obama ; K. Kobayashi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Singapore, Singapore
Conference Date: 12 October 2008
Page(s): 2,291 - 2,296
ISBN (CD): 978-1-4244-2384-2
ISBN (Paper): 978-1-4244-2383-5
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2008.4811634
Regular:

One of the core techniques for the Pavement Management Systems (PMS) is the deterioration hazard model. The hazard models stochastically forecast the deterioration progresses of pavement based on... View More

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