IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes

2008 IEEE International Conference on Systems, Man and Cybernetics (SMC 2008)

Author(s): M. Endo ; K. Tsuruta ; S. Kita ; H. Nakajima
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Singapore, Singapore
Conference Date: 12 October 2008
Page(s): 2,099 - 2,104
ISBN (CD): 978-1-4244-2384-2
ISBN (Paper): 978-1-4244-2383-5
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2008.4811601
Regular:

In a factory setting, the zero-breakdown concept of manufacturing processes has been eagerly anticipated. In this article, the notion of machine health management technology is introduced in... View More

Advertisement