IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hierarchical data envelopment analysis for confirming performance improvement

2008 IEEE International Conference on Systems, Man and Cybernetics (SMC 2008)

Author(s): Y. Sato ; E. Mukai ; K. Inoue ; S. Aoki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2008
Conference Location: Singapore, Singapore
Conference Date: 12 October 2008
Page(s): 234 - 239
ISBN (CD): 978-1-4244-2384-2
ISBN (Paper): 978-1-4244-2383-5
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2008.4811280
Regular:

In order to measure a trend of inefficient DMUs, this research has enhanced the hierarchical DEA model to time dependent situation applying discriminant analysis as a new evaluation index. The... View More

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