IEEE - Institute of Electrical and Electronics Engineers, Inc. - RF waveform metrology for characterization of non-linear amplifiers

2008 72nd ARFTG Microwave Measurement Symposium

Author(s): D.A. Humphreys ; G. Watkins ; K.A. Morris ; J. Miall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2008
Conference Location: Portland, OR, USA
Conference Date: 9 December 2008
Page(s): 69 - 72
ISBN (CD): 978-1-4244-2300-2
DOI: 10.1109/ARFTG.2008.4804285
Regular:

Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing... View More

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